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FEM microscopes, X-ray microscopes, Electron microscopes
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STM microscope / scanning tunneling / low-temperature - max. 5 °K
Low Temperature Operation at T < 5 K
Lowest Thermal Drift & Highest...
Lowest Thermal Drift & Highest...
STM microscope / scanning tunneling / low-temperature - max. 5 °K
Low Temperature Operation at T < 5 K
Lowest Thermal Drift & Highest Stability
Ultimate STM/STS/IETS Performance
Leading QPlus AFM Technology
Variable Temperature Operation
Guided 3D Coarse Positioning
Fast Cool Down
Safe & Quick Sample/Tip Exchange
Lowest Thermal Drift & Highest Stability
Ultimate STM/STS/IETS Performance
Leading QPlus AFM Technology
Variable Temperature Operation
Guided 3D Coarse Positioning
Fast Cool Down
Safe & Quick Sample/Tip Exchange
Scanning tunneling microscope / STM / under ultrahigh vacuum / UHV
Scanning Tunneling Microscopy and Spectroscopy
Spin Polarized Tunneling Microscopy and Spectroscopy
Inelastic...
Spin Polarized Tunneling Microscopy and Spectroscopy
Inelastic...
Scanning tunneling microscope / STM / under ultrahigh vacuum / UHV
Scanning Tunneling Microscopy and Spectroscopy
Spin Polarized Tunneling Microscopy and Spectroscopy
Inelastic Tunneling Spectroscopy
Scanning Force Microscopy and -Spectroscopy
Magnetic Force Microscopy / Magnetic Exchange Force Microscopy
Electrostatic Force Microscopy / Kelvin Probe
Atom Manipulation
Temperature Variation
Magnetic Field Variation (Single Axis, 2D- or 3D Vector Field)
Spin Polarized Tunneling Microscopy and Spectroscopy
Inelastic Tunneling Spectroscopy
Scanning Force Microscopy and -Spectroscopy
Magnetic Force Microscopy / Magnetic Exchange Force Microscopy
Electrostatic Force Microscopy / Kelvin Probe
Atom Manipulation
Temperature Variation
Magnetic Field Variation (Single Axis, 2D- or 3D Vector Field)
Scanning probe microscope / variable temperature / SPM - 25 – 1500 °K
25 K 1500 K
True pA STM
Improved dI/dV Spectroscopy
Beam Deflection AFM
QPlus sensor AFM
In-situ Evaporation
The...
True pA STM
Improved dI/dV Spectroscopy
Beam Deflection AFM
QPlus sensor AFM
In-situ Evaporation
The...
Scanning probe microscope / variable temperature / SPM - 25 – 1500 °K
25 K 1500 K
True pA STM
Improved dI/dV Spectroscopy
Beam Deflection AFM
QPlus sensor AFM
In-situ Evaporation
The Omicron VT SPM is a well established microscope in many research labs for Scanning Probe Microscopy. It won the prominent R&D award in 1996. To date, more than 500 instruments have been delivered and successfully installed around the world. The volume of research results and publications is a conclusive proof for the performance, quality, and versatility of the Variable Temperature SPM design.
True pA STM
Improved dI/dV Spectroscopy
Beam Deflection AFM
QPlus sensor AFM
In-situ Evaporation
The Omicron VT SPM is a well established microscope in many research labs for Scanning Probe Microscopy. It won the prominent R&D award in 1996. To date, more than 500 instruments have been delivered and successfully installed around the world. The volume of research results and publications is a conclusive proof for the performance, quality, and versatility of the Variable Temperature SPM design.
Scanning probe microscope / SPM - 30 - 400 °K | Fermi
15 K 400 K
Compact Design
Tip Exchange & 2D Coarse
Sample and Tip Cooled
Low Thermal Drift
STM, AFM & Spectroscopy
Sub pA STM
Internal Eddy Current Damping System
The new Fermi SPM is a compact solution for UHV SPM in a temperature range from...
Compact Design
Tip Exchange & 2D Coarse
Sample and Tip Cooled
Low Thermal Drift
STM, AFM & Spectroscopy
Sub pA STM
Internal Eddy Current Damping System
The new Fermi SPM is a compact solution for UHV SPM in a temperature range from...
Scanning probe microscope / SPM - 30 - 400 °K | Fermi
15 K 400 K
Compact Design
Tip Exchange & 2D Coarse
Sample and Tip Cooled
Low Thermal Drift
STM, AFM & Spectroscopy
Sub pA STM
Internal Eddy Current Damping System
The new Fermi SPM is a compact solution for UHV SPM in a temperature range from 15 K to 400 K. It has been developed to close the gap between the established Omicron LT STM for ultimate spectroscopy performance and the flexible concept of the Omicron VT series.
The new Fermi SPM offers a cost effective alternative for users with a stronger focus on tunnelling spectroscopy experiments.
The compact design uses a LHe flow cryostat. In contrast to the VT series (sample cooled, tip at room temperature), thermal shields keep tip and sample in the Fermi SPM at low temperature during cooling experiments. This guarantees low thermal drift between tip and sample and makes the Fermi SPM an ideal and cost effective solution for imaging, tunnelling spectroscopy and atom manipulation experiments.
The compact Fermi SPM is mounted on a DN 100 CF flange and easy to integrate on systems using the proven bolt-on concept.
Compact Design
Tip Exchange & 2D Coarse
Sample and Tip Cooled
Low Thermal Drift
STM, AFM & Spectroscopy
Sub pA STM
Internal Eddy Current Damping System
The new Fermi SPM is a compact solution for UHV SPM in a temperature range from 15 K to 400 K. It has been developed to close the gap between the established Omicron LT STM for ultimate spectroscopy performance and the flexible concept of the Omicron VT series.
The new Fermi SPM offers a cost effective alternative for users with a stronger focus on tunnelling spectroscopy experiments.
The compact design uses a LHe flow cryostat. In contrast to the VT series (sample cooled, tip at room temperature), thermal shields keep tip and sample in the Fermi SPM at low temperature during cooling experiments. This guarantees low thermal drift between tip and sample and makes the Fermi SPM an ideal and cost effective solution for imaging, tunnelling spectroscopy and atom manipulation experiments.
The compact Fermi SPM is mounted on a DN 100 CF flange and easy to integrate on systems using the proven bolt-on concept.
Scanning tunneling microscope / STM / under ultrahigh vacuum / UHV - UHV STM 1
* Unsurpassed stability and resolution
* Eddy current damping
* UHV sample/tip exchange
* In-vacuum I/V converter
One year after Binnig and Rohrer won...
* Eddy current damping
* UHV sample/tip exchange
* In-vacuum I/V converter
One year after Binnig and Rohrer won...
Scanning tunneling microscope / STM / under ultrahigh vacuum / UHV - UHV STM 1
* Unsurpassed stability and resolution
* Eddy current damping
* UHV sample/tip exchange
* In-vacuum I/V converter
One year after Binnig and Rohrer won the Nobel Prize in 1986, Omicron delivered the first commercial UHV Scanning Probe Microscope, the legendary UHV STM1. The UHV STM1 is still the benchmark for stability and high-performance STM measurements.
With the UHV STM1 Omicron introduced the famous eddy current vibration isolation system which defined a milestone in UHV SPM technology. This proven design is typical for all Omicron SPM’s and allows high resolution Scanning Tunnelling Microscopy operation even in non-ideal conditions for more than 25
* Eddy current damping
* UHV sample/tip exchange
* In-vacuum I/V converter
One year after Binnig and Rohrer won the Nobel Prize in 1986, Omicron delivered the first commercial UHV Scanning Probe Microscope, the legendary UHV STM1. The UHV STM1 is still the benchmark for stability and high-performance STM measurements.
With the UHV STM1 Omicron introduced the famous eddy current vibration isolation system which defined a milestone in UHV SPM technology. This proven design is typical for all Omicron SPM’s and allows high resolution Scanning Tunnelling Microscopy operation even in non-ideal conditions for more than 25
AFM microscope / atomic force - NX20
The leading nano metrology tool for failure analysis and large sample research
As an FA engineer, youre expected to deliver results. Theres no room for error in the data provided by your instruments. Park NX20, with its reputation as the worlds most accurate large sample AFM, is rated so highly...
As an FA engineer, youre expected to deliver results. Theres no room for error in the data provided by your instruments. Park NX20, with its reputation as the worlds most accurate large sample AFM, is rated so highly...
AFM microscope / atomic force - NX20
The leading nano metrology tool for failure analysis and large sample research
As an FA engineer, youre expected to deliver results. Theres no room for error in the data provided by your instruments. Park NX20, with its reputation as the worlds most accurate large sample AFM, is rated so highly in the semiconductor and hard disk industry for its data accuracy.
More powerful failure analysis solutions
Park NX20 is equipped with unique features that make it easier to uncover the reasons behind device failure and develop more creative solutions. Its unparalleled precision provides high resolution data that lets you focus on your work, while its True Non-Contact™ mode scan keeps tips sharper and longer, so you wont have to waste as much time and money replacing them.
Easy to use, even for entry level engineers
Park NX20 has one of the most user friendly designs and automated interfaces in the industry, so you wont have to spend as much time and energy using the tool and supervising junior engineers with the system. This lets you focus your experience on solving bigger problems and providing insightful and timely failure analysis to your customers.
As an FA engineer, youre expected to deliver results. Theres no room for error in the data provided by your instruments. Park NX20, with its reputation as the worlds most accurate large sample AFM, is rated so highly in the semiconductor and hard disk industry for its data accuracy.
More powerful failure analysis solutions
Park NX20 is equipped with unique features that make it easier to uncover the reasons behind device failure and develop more creative solutions. Its unparalleled precision provides high resolution data that lets you focus on your work, while its True Non-Contact™ mode scan keeps tips sharper and longer, so you wont have to waste as much time and money replacing them.
Easy to use, even for entry level engineers
Park NX20 has one of the most user friendly designs and automated interfaces in the industry, so you wont have to spend as much time and energy using the tool and supervising junior engineers with the system. This lets you focus your experience on solving bigger problems and providing insightful and timely failure analysis to your customers.
AFM microscope / atomic force - NX10
Park NX10 produces data you can trust, replicate, and publish at the highest nano resolution. From sample setting to full scan imaging, measurement, and analysis, Park NX10 saves you time every step of the way. With more time and better data, you can focus on doing more innovative research.
Better...
Better...
AFM microscope / atomic force - NX10
Park NX10 produces data you can trust, replicate, and publish at the highest nano resolution. From sample setting to full scan imaging, measurement, and analysis, Park NX10 saves you time every step of the way. With more time and better data, you can focus on doing more innovative research.
Better accuracy means better data
Park NX10 produces data you can trust, replicate, and publish at the highest nano resolution. It features the worlds only true non-contact AFM that prolongs tip life while preserving your sample, and flexure based independent XY and Z scanner for unparalleled accuracy and resolution.
Better accuracy means better productivity
From sample setting to full scan imaging, measurement, and analysis, Park NX10 saves you time every step of the way. The user friendly interface, easy laser alignment, automatic tip approach, and analysis software allow you to get publishable results faster.
Better accuracy means better research
With more time and better data, you can focus on doing more innovative research. And the Park NX10s wide range of measurement modes and customizable design means it can be easily tailored to the most unique projects.
Better accuracy means better data
Park NX10 produces data you can trust, replicate, and publish at the highest nano resolution. It features the worlds only true non-contact AFM that prolongs tip life while preserving your sample, and flexure based independent XY and Z scanner for unparalleled accuracy and resolution.
Better accuracy means better productivity
From sample setting to full scan imaging, measurement, and analysis, Park NX10 saves you time every step of the way. The user friendly interface, easy laser alignment, automatic tip approach, and analysis software allow you to get publishable results faster.
Better accuracy means better research
With more time and better data, you can focus on doing more innovative research. And the Park NX10s wide range of measurement modes and customizable design means it can be easily tailored to the most unique projects.
Atomic force microscope / AFM / high-resolution - XE15
Increase your productivity with our powerfully versatile atomic force microscope
The Park XE15 includes many unique capabilities that make it ideal for shared labs that handle a diverse range of samples, researchers doing multi variant experiments, and failure analysis engineers working on wafers. Its reasonable price and robust...
The Park XE15 includes many unique capabilities that make it ideal for shared labs that handle a diverse range of samples, researchers doing multi variant experiments, and failure analysis engineers working on wafers. Its reasonable price and robust...
Atomic force microscope / AFM / high-resolution - XE15
Increase your productivity with our powerfully versatile atomic force microscope
The Park XE15 includes many unique capabilities that make it ideal for shared labs that handle a diverse range of samples, researchers doing multi variant experiments, and failure analysis engineers working on wafers. Its reasonable price and robust feature set also make it one of the best value large-sample AFMs in the industry.
Unique MultiSample™ scan boosts research productivity
Maximize your efficiency with the only AFM that offers the ability to image and measure multiple samples in one pass. Simply load the stage with your samples and initiate the scan process. This feature also allows you to scan the samples under identical environmental conditions, improving the accuracy and reliability of your data.
Large sample size increases possibilities
Unlike most AFMs, the Park XE15 can scan a sample of up to 200 mm x 200 mm. This makes it ideal for researchers wanting to scan larger samples or failure analysis engineers who need to place silicon wafers on the stage.
Features adaptable to any need
The Park XE15 features our most inclusive set of scan modes and can process a range of sample sizes. This makes it uniquely suited to shared labs with a wide range of individual requirements.
The Park XE15 includes many unique capabilities that make it ideal for shared labs that handle a diverse range of samples, researchers doing multi variant experiments, and failure analysis engineers working on wafers. Its reasonable price and robust feature set also make it one of the best value large-sample AFMs in the industry.
Unique MultiSample™ scan boosts research productivity
Maximize your efficiency with the only AFM that offers the ability to image and measure multiple samples in one pass. Simply load the stage with your samples and initiate the scan process. This feature also allows you to scan the samples under identical environmental conditions, improving the accuracy and reliability of your data.
Large sample size increases possibilities
Unlike most AFMs, the Park XE15 can scan a sample of up to 200 mm x 200 mm. This makes it ideal for researchers wanting to scan larger samples or failure analysis engineers who need to place silicon wafers on the stage.
Features adaptable to any need
The Park XE15 features our most inclusive set of scan modes and can process a range of sample sizes. This makes it uniquely suited to shared labs with a wide range of individual requirements.
AFM microscope / atomic force - XE7
Park XE7 has all the state-of-the-art technology you've come to expect from Park Systems, at a price your lab can afford. Designed with the same attention to detail as our more advanced models, the XE7 allows you to do your research on time and within budget.
Uncompromised High Performance
Park XE7 provides accurate measurement at highest nanoscale resolution than any other products...
Uncompromised High Performance
Park XE7 provides accurate measurement at highest nanoscale resolution than any other products...
AFM microscope / atomic force - XE7
Park XE7 has all the state-of-the-art technology you've come to expect from Park Systems, at a price your lab can afford. Designed with the same attention to detail as our more advanced models, the XE7 allows you to do your research on time and within budget.
Uncompromised High Performance
Park XE7 provides accurate measurement at highest nanoscale resolution than any other products in its class.It allows you to obtain sample images and its characteristic measurements true to its nano structure thanks to its flat, orthogonal, and linear scan measurements by its unique AFM architecture: independent XY and Z, flexure based scans. Furthermore, Park's unique True Non-Contact™ mode provides you with the sharpest images, scan after scan without declining resolution.
For Current and Future Needs
Park XE7 empowers you to innovate now and in the future. It gives you ready access to the largest number of measurement modes in the industry. You can employ any of these modes now, and in the future to support your evolving needs. What's more, the XE7 has the most open access design in the market that allows you to integrate and combine accessories and instruments to tailor it to your unique research requirements.
Easy to Use and High Productivity
Park XE7 together with its intuitive graphical user interface, and its automated tools, allows even novice users get from sample placement to scan results, fast. Starting from pre-aligned tip mount, easy sample and tip exchange, simple laser alignment, on-axis top-down optical viewing, to user friendly scan controls and software processing, the XE7 provides highest research productivity in AFM.
Uncompromised High Performance
Park XE7 provides accurate measurement at highest nanoscale resolution than any other products in its class.It allows you to obtain sample images and its characteristic measurements true to its nano structure thanks to its flat, orthogonal, and linear scan measurements by its unique AFM architecture: independent XY and Z, flexure based scans. Furthermore, Park's unique True Non-Contact™ mode provides you with the sharpest images, scan after scan without declining resolution.
For Current and Future Needs
Park XE7 empowers you to innovate now and in the future. It gives you ready access to the largest number of measurement modes in the industry. You can employ any of these modes now, and in the future to support your evolving needs. What's more, the XE7 has the most open access design in the market that allows you to integrate and combine accessories and instruments to tailor it to your unique research requirements.
Easy to Use and High Productivity
Park XE7 together with its intuitive graphical user interface, and its automated tools, allows even novice users get from sample placement to scan results, fast. Starting from pre-aligned tip mount, easy sample and tip exchange, simple laser alignment, on-axis top-down optical viewing, to user friendly scan controls and software processing, the XE7 provides highest research productivity in AFM.
AFM microscope / atomic force / automated - XE-3DM
Automated Industrial AFM for High-Resolution 3D Metrology
Park Systems has introduced the revolutionary XE-3DM, the completely automated AFM system designed for overhang profiles, high-resolution sidewall imaging, and critical angle measurements. With the patented decoupled XY and Z scanning system with tilted Z-scanner, it overcomes the challenges of the normal and flare...
Park Systems has introduced the revolutionary XE-3DM, the completely automated AFM system designed for overhang profiles, high-resolution sidewall imaging, and critical angle measurements. With the patented decoupled XY and Z scanning system with tilted Z-scanner, it overcomes the challenges of the normal and flare...
AFM microscope / atomic force / automated - XE-3DM
Automated Industrial AFM for High-Resolution 3D Metrology
Park Systems has introduced the revolutionary XE-3DM, the completely automated AFM system designed for overhang profiles, high-resolution sidewall imaging, and critical angle measurements. With the patented decoupled XY and Z scanning system with tilted Z-scanner, it overcomes the challenges of the normal and flare tip methods in accurate sidewall analysis. In utilizing our True Non-Contact Mode™, the XE-3DM enables non-destructive measurement of soft photoresist surfaces with high aspect ratio tips.
Accuracy Like Never Before
Shrinking form factors are driving the need to design at the nanoscale level in the semiconductor markets, but traditional metrology tools have lacked the accuracy needed for nanoscale design and manufacturing. Park Systems has met this challenge in industrial metrology with enabling breakthroughs: Crosstalk Elimination (XE) enables artifact-free and non-destructive imaging New 3D AFM enables high resolution imaging of sidewall or undercut features.
Throughput Like Never Before
AFMs that have enabled nanoscale design have traditionally not been fast enough for use in production quality control. That has changed with Park Systems' revolutionary gains in throughput, enabling AFMs for use in automatic in-line manufacturing. These include automatic tip exchange where our novel magnetic approach has a 99% success rate, higher than traditional vacuum techniques. Also, ful
Park Systems has introduced the revolutionary XE-3DM, the completely automated AFM system designed for overhang profiles, high-resolution sidewall imaging, and critical angle measurements. With the patented decoupled XY and Z scanning system with tilted Z-scanner, it overcomes the challenges of the normal and flare tip methods in accurate sidewall analysis. In utilizing our True Non-Contact Mode™, the XE-3DM enables non-destructive measurement of soft photoresist surfaces with high aspect ratio tips.
Accuracy Like Never Before
Shrinking form factors are driving the need to design at the nanoscale level in the semiconductor markets, but traditional metrology tools have lacked the accuracy needed for nanoscale design and manufacturing. Park Systems has met this challenge in industrial metrology with enabling breakthroughs: Crosstalk Elimination (XE) enables artifact-free and non-destructive imaging New 3D AFM enables high resolution imaging of sidewall or undercut features.
Throughput Like Never Before
AFMs that have enabled nanoscale design have traditionally not been fast enough for use in production quality control. That has changed with Park Systems' revolutionary gains in throughput, enabling AFMs for use in automatic in-line manufacturing. These include automatic tip exchange where our novel magnetic approach has a 99% success rate, higher than traditional vacuum techniques. Also, ful
Vertical injection molding machine / hydraulic / rotating table / servo - 40 - 270 t | VM R
VM R 40 – 270 t of WITTMAN BATTENFELD are a series of rotary table machines equipped with injection units that can be used as horizontal or vertical units and...
Vertical injection molding machine / hydraulic / rotating table / servo - 40 - 270 t | VM R
VM R 40 – 270 t of WITTMAN BATTENFELD are a series of rotary table machines equipped with injection units that can be used as horizontal or vertical units and 3 symmetrically placed clamping cylinders all encased in a compact and durable housing.
These machines offers variations with different clamping force sizes from 40 to 270 t and rotary tables with sizes ranging from 752 mm to 1,755 mm in diameter. Further optimization is achievable by integration of various automation with easy accessibility of the parts. With high tech clamping unit, clamping force can be evenly distributed fast and efficiently.
These machines offers variations with different clamping force sizes from 40 to 270 t and rotary tables with sizes ranging from 752 mm to 1,755 mm in diameter. Further optimization is achievable by integration of various automation with easy accessibility of the parts. With high tech clamping unit, clamping force can be evenly distributed fast and efficiently.