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AFM microscope / atomic force - NX10
Park NX10 produces data you can trust, replicate, and publish at the highest nano resolution. From sample setting to full scan imaging, measurement, and analysis, Park NX10 saves you time every step of the way. With more time and better data, you can focus on doing more innovative research.Better accuracy means better data
Park NX10 produces data you can trust, replicate, and publish at the highest nano resolution. It features the worlds only true non-contact AFM that prolongs tip life while preserving your sample, and flexure based independent XY and Z scanner for unparalleled accuracy and resolution.
Better accuracy means better productivity
From sample setting to full scan imaging, measurement, and analysis, Park NX10 saves you time every step of the way. The user friendly interface, easy laser alignment, automatic tip approach, and analysis software allow you to get publishable results faster.
Better accuracy means better research
With more time and better data, you can focus on doing more innovative research. And the Park NX10s wide range of measurement modes and customizable design means it can be easily tailored to the most unique projects.