Form and surface measuring instruments

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Bruker Nano Surfaces

Profilometer - Dektak XTL™

The new Dektak Xtl™ stylus profile gives amazingly exact, repeatable, and reproducible metrology for an extensive variety of applications. With its capability to suit examples of up to 350mm x 350mm, this framework brings fanciful Dektak execution to 200mm and 300mm wafer manufacturing....

Profilometer - Dektak XTL™

The new Dektak Xtl™ stylus profile gives amazingly exact, repeatable, and reproducible metrology for an extensive variety of applications. With its capability to suit examples of up to 350mm x 350mm, this framework brings fanciful Dektak execution to 200mm and 300mm wafer manufacturing.

The Dektak XTL characteristics a little footprint and coordinated detachment with interlocking entryways, making it perfect throughout today's demanding floor situations. Its double Polaroid structural planning empowers upgraded spatial mindfulness, and its abnormal amount of computerization improves producing throughput. Brokers restrictive Vision64 progressed creation interface with discretionary example distinguishment, making the process of information gathering an instinctive and repeatable process. It minimizes administrator to-administrator variability.

With its exceptional mixture of unrivaled execution and convenience, the Dektak XTL is the new standard for modern film deposition observing in touch-board, solar, flat board display and semiconductor businesses for research and QA/Q.

Profilometer - DektakXT™

The The Dektak XT™ stylus profiler, manufactured by Bruker, has an innovative design that provides optimum consistency of under five angstroms...

Profilometer - DektakXT™

The The Dektak XT™ stylus profiler, manufactured by Bruker, has an innovative design that provides optimum consistency of under five angstroms and up to 40% increase of scanning speeds. It incorporates capabilities that enables the critical nanometer-level film, the step and surface measurements that provide future enhancements in the microelectronics, semiconductor, solar, high-brightness LED, medical, scientific and materials science markets. It is combined with leading-edge "smart electronics" that establishes a new low-noise benchmark for stylus profiling.
DR. JOHANNES HEIDENHAIN GmbH

Laser measuring system / tool / non-contact - ø 0.03 - 37 mm, ±0.2 nm | TL nano

The HEIDENHAIN TL Nano is designed and developed to provide accurate tool measurement...

Laser measuring system / tool / non-contact - ø 0.03 - 37 mm, ±0.2 nm | TL nano

The HEIDENHAIN TL Nano is designed and developed to provide accurate tool measurement without making any contact. Integrated with the latest in laser technology, it can measure different tools for lengths, diameters, wear and tear even breakage at top speed. It also automatically records the result under the tool table.

Laser measuring system / tool / non-contact - ø 0.03 - 180 mm, ±0.2 - 1 nm | TL micro series

The Micro and TL Nano laser systems are utilized to measure tools at the rated speed without making contact. By using the incorporated measuring styles, tool lengths and diameters can be measured,...

Laser measuring system / tool / non-contact - ø 0.03 - 180 mm, ±0.2 - 1 nm | TL micro series

The Micro and TL Nano laser systems are utilized to measure tools at the rated speed without making contact. By using the incorporated measuring styles, tool lengths and diameters can be measured,...

Tool measuring machine - VM 182

The VM 182 comparator system provides acceptance testing, inspection and calibration of machine tools along with a measuring equipment with traverse ranges up to 1520 mm. The VM 182 can...

Tool measuring machine - VM 182

The VM 182 comparator system provides acceptance testing, inspection and calibration of machine tools along with a measuring equipment with traverse ranges up to 1520 mm. The VM 182 can be used by the machine tool builders and distributors in order to identify the linear and nonlinear error curves and the reversal error of machine axes as per ISO 230-2.

Additionally, It can also help in measuring the guideway error orthogonal to the traverse direction of the machine axis. These error values can be used in the subsequent electronics (display unit or control) for electronic error compensation.

The HEIDENHAIN TNC contouring controls are highly useful in direct downloading of the error compensation values.
JENOPTIK Industrial Metrology Germany GmbH

Roughness tester bluetooth - HOMMEL-ETAMIC W5

Jenoptik offers the best system for functions in measuring. Its product line comprise of solid mobile roughness measuring instruments and practical stationary systems for...

Roughness tester bluetooth - HOMMEL-ETAMIC W5

Jenoptik offers the best system for functions in measuring. Its product line comprise of solid mobile roughness measuring instruments and practical stationary systems for topography, contour and roughness measurements.

HOMMEL-ETAMIC W5 has a wide variety of measurement functions with a comprehensive collection of accessories and probes. It is the best roughness measuring system for accurate and handy surface measurement on the production line because of its practical, ergonomic structure; this device simply adapts into the user's hand. As a result, W5's precision and accuracy is able to compete with the efficiency of more costly stationary systems.

Surface measuring system / profile - HOMMEL-ETAMIC T8000 R

The systems in the HOMMEL-ETAMIC T8000 R product series are suitable for roughness measurement, being designed to tackle the most demanding tasks when it comes to professional roughness metrology. These devices are...

Surface measuring system / profile - HOMMEL-ETAMIC T8000 R

The systems in the HOMMEL-ETAMIC T8000 R product series are suitable for roughness measurement, being designed to tackle the most demanding tasks when it comes to professional roughness metrology. These devices are compatible with the latest international standards, being used both in production and in measuring rooms. Note that the design allows different expansion levels of the measuring station configurations and comes with various upgrade possibilities for topography and contour measurement.

The high precision traverse is possible for skidless measurement, while the modular structure PC-based evaluation unit comes with a robust Gauss filter, in accordance to ISO 16610-31 standards. Note that the traverse length is between 60 and 120mm, while the suitability for waviness and roughness measurement is also worth mentioning.

High-precision form and surface measuring machine - HOMMEL-ETAMIC nanoscan 855

HOMMEL-ETAMIC nanoscan 855 can be used to measure the roughness and contour with maximum precision. This device is designed by using the most innovative measuring system that is based on Opto-mechanical technology. In this device, the scanning...

High-precision form and surface measuring machine - HOMMEL-ETAMIC nanoscan 855

HOMMEL-ETAMIC nanoscan 855 can be used to measure the roughness and contour with maximum precision. This device is designed by using the most innovative measuring system that is based on Opto-mechanical technology. In this device, the scanning of the work-piece is transmitted to the optical scale with the help of a high-precision mechanical system. It is then interpreted by a laser interferometer.

The innovative design and technology used by this device makes it an ideal choice for high precision applications. This device is technologically innovative and features an electronic probe arm detection. The arms of the probe are detected automatically and assigned to the measuring task. The damage to the Electronic stylus tip is eliminated with the help of an electronic speed limiter that prevents unusual contact with the work piece. One can adjust the probe setting of the force can be adjusted electronically to avoid errors while measuring.

Surface measuring machine - HOMMEL-ETAMIC toposcan

The HOMMEL-ETAMIC toposcan from Jenoptik is a surface inspector inside a cylinder bore that features a super zoom. The product exhibits a tactile roughness measurement...

Surface measuring machine - HOMMEL-ETAMIC toposcan

The HOMMEL-ETAMIC toposcan from Jenoptik is a surface inspector inside a cylinder bore that features a super zoom. The product exhibits a tactile roughness measurement with ability to read all important surface parameters. Moreover, with the compact dimension of the product, it has the ability to perform for mobile appilications in production using its toposcan measuring system. The toposcan also is able to completely measure and evaluate the entire inside surface of cylinder bores. The HOMMEL-ETAMIC toposcan is characterized by a convenient construction that is controlled centrally via a PC and the TOPOWIN software.

Form and surface measuring machine - HOMMEL-ETAMIC roundscan 5xx

The HOMMEL-ETAMIC roundscan 5xx from JENOPTIK is a device that can measure combined form and roughness. Engineered as a form measuring instrument with an innate ergonomic design,...

Form and surface measuring machine - HOMMEL-ETAMIC roundscan 5xx

The HOMMEL-ETAMIC roundscan 5xx from JENOPTIK is a device that can measure combined form and roughness. Engineered as a form measuring instrument with an innate ergonomic design, the HOMMEL-ETAMIC roundscan 5xx features a fully automatic centering and leveling technology together with measuring axles controlled by CNC. These capabilities enable the device to acquire measurement data from some of the most complex pieces. Thanks to the variety of components including the single clamping operation system, measuring circles, vertical measuring axis and more, data regarding the combined form, twist and roughness from a wide variety of pieces is easily acquired regardless of their size and height.
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