Profilometer - Dektak XTL™

Profilometer - Dektak XTL™
Bruker Nano Surfaces The new Dektak Xtl™ stylus profile gives amazingly exact, repeatable, and reproducible metrology for an extensive variety of applications. With its capability to suit examples of up to 350mm x 350mm, this framework brings fanciful Dektak execution to 200mm and 300mm wafer manufacturing.

The Dektak XTL characteristics a little footprint and coordinated detachment with interlocking entryways, making it perfect throughout today's demanding floor situations. Its double Polaroid structural planning empowers upgraded spatial mindfulness, and its abnormal amount of computerization improves producing throughput. Brokers restrictive Vision64 progressed creation interface with discretionary example distinguishment, making the process of information gathering an instinctive and repeatable process. It minimizes administrator to-administrator variability.

With its exceptional mixture of unrivaled execution and convenience, the Dektak XTL is the new standard for modern film deposition observing in touch-board, solar, flat board display and semiconductor businesses for research and QA/Q.

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