Form and surface measuring instruments

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Gleason

Diameter measurement stand / length - DOP 160

The DOP 160 is a pitch diameter measurement systems that executes modal operation with cost-effectiveness and enables reduction on time needed for inspection. This constant-pressure...

Diameter measurement stand / length - DOP 160

The DOP 160 is a pitch diameter measurement systems that executes modal operation with cost-effectiveness and enables reduction on time needed for inspection. This constant-pressure gauging system ensures accuracy on the total range of the gage. It features a single smooth ring requirement for initial setup, needless setting masters for external setup in component measurement along with a digital readout with data output port connectable to an SPC processor. It is ideally suited for manufacturing cell or inspection laboratory. It secures definite dimension over balls or pins measurements permitting validation of actual tooth thickness or space width at pitch diameter.

Diameter measurement stand / length - DOP 320

The DOP 32 functional gauge is a pitch diameter measurement system that is simple to use for inspection labs or in manufacturing cells. It minimizes inspection...

Diameter measurement stand / length - DOP 320

The DOP 32 functional gauge is a pitch diameter measurement system that is simple to use for inspection labs or in manufacturing cells. It minimizes inspection time and guarantees repeatable and reproducible results. It is a more cost-effective option in terms of controlling component size. It delivers reliable and highly accurate dimension over pins or balls measurements to confirm actual tooth thickness (or space width) at the pitch diameter through the utilization of a one of a kind constant-pressure gaging system. It is easy to setup since it only requires one certified, smooth ring and does not need external systems.
MAHR

Concentricity test bench - 818

The Center Bench 818 by MAHR is very convenient and flexible. This high...

Concentricity test bench - 818

The Center Bench 818 by MAHR is very convenient and flexible. This high quality and high performing technology allows both tail stocks to be moved or adjusted which makes it easier to use. The flatness of the supporting surface of this great innovation is made in accordance to DIN 876/1.

Diameter measurement stand / length - Diamar nk

Millimar Diamar nk/280 universal measuring units are ideal for measurement...

Diameter measurement stand / length - Diamar nk

Millimar Diamar nk/280 universal measuring units are ideal for measurement of outer and inner diameters as well as measurement of diameter over balls on gears. The devices are suitable for use at shopfloor and production.

The outside diameter of nk is 0-225 mm and for 280 is 0-150 mm.

Measurement stand - Precimar 828 CiM

Precimar 828 CiM is the number 1 choice...

Measurement stand - Precimar 828 CiM

Precimar 828 CiM is the number 1 choice in choosing universal measuring machines proven by its High measuring speed, accuracy and operating comfort.

Diameter measurement stand / length - Linear 100

The Linear 100 is a measuring instrument ideally used in manufacturing field.

Its simple operation produces measurements in high speed and accepts new measurement...

Diameter measurement stand / length - Linear 100

The Linear 100 is a measuring instrument ideally used in manufacturing field.

Its simple operation produces measurements in high speed and accepts new measurement tasks easily. This measuring device provides flexible measurements with a range of up to 15mm-100 mm internally and externally. It can also be interchanged between internal and external measurements without any fine tuning.

Encased in a solid cast body that can withstand wear and tear on the outset. It is also built with a USB interface for printer or PC allowing easy transfer of the measured values to a computer. It can be further optimized with the integration of MarCom software for Windows programs.

Roughness tester portable - Pocket Surf

The latest Pocket-Surf innovation of Mahr Metrology is specifically designed economically with complete portable instrument which functions on traceable surface roughness measurements....

Roughness tester portable - Pocket Surf

The latest Pocket-Surf innovation of Mahr Metrology is specifically designed economically with complete portable instrument which functions on traceable surface roughness measurements. It can be used confidently in production, on the shop floor and in the laboratory. Built with a durable cast aluminum housing, to guarantee long term service. It known for its adaptability as it can be used to measure any one of four, switch-selectable, parameters: Ra , Rmax/Ry , Rz. It certainly an operator friendly with its “battery low“ signals display and has easy-to-read LCD readout indicating the measured roughness value, in micro-inches or micrometers immediately and accurately.
KLA - TENCOR

Surface profile measuring machine for semiconductor - HRP-350

The HRP-350 is an automatic, sophisticated surface outline topography metrology instrument, comprising maximum resolution/elevated-aspect ratio, stylus-derived surface outlining...

Surface profile measuring machine for semiconductor - HRP-350

The HRP-350 is an automatic, sophisticated surface outline topography metrology instrument, comprising maximum resolution/elevated-aspect ratio, stylus-derived surface outlining for most important edge 300mm uses. This surface outline dimension instrument's ultra-superior 20nm stylus tip alternative allows down to 45nm-creation surface outlining at lucrative throughputs for important transistor and interrelate uses. Attributing diamond styli down to a radius of 20nm and a lesser-sound podium for improved outline dimension compassion, the HRP-350 surface outline dimension system presents nanometer-scale stylus skill, which equals Atomic Force Microscopy resolution - with no modeling necessities.

Surface profile measuring machine for semiconductor - HRP-250

The HRP-250 is an automated, advanced surface topography metrology device that is specially designed with an enhanced resolution mode allowing precise control of nano-scale features of implementations...

Surface profile measuring machine for semiconductor - HRP-250

The HRP-250 is an automated, advanced surface topography metrology device that is specially designed with an enhanced resolution mode allowing precise control of nano-scale features of implementations that directly affects device performance. It has an optional ultra-fine 20nm stylus tip that ensures 45nm-generation surface profiling with inexpensive through-puts for vital transistor and interconnect functions. It features stylus-based surface profiling for cutting -edge 200mm operations, diamond styli down to 20nm radius and muffled platform for improved measurement sensitivity along with high resolution/high-aspect ratio. This surface topography profiling system delivers nanometer-scale stylus technology that complies with AFM resolution without any modeling requirements.

Profilometer optical - Alpha-Step IQ

The Alpha-Step IQ is a mechanical, stylus-based step profiler that can measure waviness, roughness, step heights up to 0.1%, save programs for later use, provide data analysis and image capture of scans....

Profilometer optical - Alpha-Step IQ

The Alpha-Step IQ is a mechanical, stylus-based step profiler that can measure waviness, roughness, step heights up to 0.1%, save programs for later use, provide data analysis and image capture of scans. It features an advanced and customizable 2D surface profiling analysis capabilities, enables easy location measurement via saved site image with recipe, has an excellent surface profiling process repeatability and reproducibility. It precisely determines and analyzes thin step heights, surface microroughness and overall error forms on thin film surface coatings. Also, it offers sufficient vertical range for large topography variations, has multiple language support for users with a worldwide presence and enables faster surface profiling analysis routines by applying saved sets of analysis instructions.
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