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Ellipsometer spectroscopic
Spectroscopic ellipsometry is a powerful tool for thin film metrology. omt implements this method in an easy-to-use system with an advanced modular optical and mechanical design...
Ellipsometer spectroscopic
Spectroscopic ellipsometry is a powerful tool for thin film metrology. omt implements this method in an easy-to-use system with an advanced modular optical and mechanical design mainly for industrial applications.
ellipsometry vs. reflectometry (TFA)
Reflectometry is often much simpler to perform than ellipsometry.
Reflectometry is in general less expensive than ellipsometry.
omts TFA does not use focusing optics allowing reflectometry to be insensitive to sample vibrations.
Measurements on moving samples are possible.
omts TFA measurement heads can be used in harsh environments.
In an industrial setting, a TFA can provide real-time feedback and QA.
ellipsometry vs. reflectometry (TFA)
Reflectometry is often much simpler to perform than ellipsometry.
Reflectometry is in general less expensive than ellipsometry.
omts TFA does not use focusing optics allowing reflectometry to be insensitive to sample vibrations.
Measurements on moving samples are possible.
omts TFA measurement heads can be used in harsh environments.
In an industrial setting, a TFA can provide real-time feedback and QA.
Ellipsometer - LEOI-44
Features
Ideal for Demo
Observing Polarized Reflection
Measuring Refractive Index
Determining Polarization Change
Introduction
This is a manually operated experimental demonstrator of...
Ideal for Demo
Observing Polarized Reflection
Measuring Refractive Index
Determining Polarization Change
Introduction
This is a manually operated experimental demonstrator of...
Ellipsometer - LEOI-44
Features
Ideal for Demo
Observing Polarized Reflection
Measuring Refractive Index
Determining Polarization Change
Introduction
This is a manually operated experimental demonstrator of...
Ideal for Demo
Observing Polarized Reflection
Measuring Refractive Index
Determining Polarization Change
Introduction
This is a manually operated experimental demonstrator of...
Ellipsometer spectroscopic - M-2000
The M-2000 line of spectroscopic ellipsometers is engineered to meet the diverse demands of thin film characterization. An advanced optical design, wide spectral range, and fast data...
Ellipsometer spectroscopic - M-2000
The M-2000 line of spectroscopic ellipsometers is engineered to meet the diverse demands of thin film characterization. An advanced optical design, wide spectral range, and fast data...
Ellipsometer spectroscopic - alpha-SE®
For routine measurements of thin film thickness and refractive...
Ellipsometer spectroscopic - alpha-SE®
For routine measurements of thin film thickness and refractive...
Ellipsometer spectroscopic - VASE®
The VASE is our most accurate and versatile ellipsometer for research on all types of materials: semiconductors, dielectrics, polymers, metals, multi-layers, and more.
It...
It...
Ellipsometer spectroscopic - VASE®
The VASE is our most accurate and versatile ellipsometer for research on all types of materials: semiconductors, dielectrics, polymers, metals, multi-layers, and more.
It...
It...
Ellipsometer spectroscopic / automated - VUV-VASE®
The VUV-VASE variable angle spectroscopic ellipsometer is the standard in optical characterization of materials used in lithography applications. Its measurement...
Ellipsometer spectroscopic / automated - VUV-VASE®
The VUV-VASE variable angle spectroscopic ellipsometer is the standard in optical characterization of materials used in lithography applications. Its measurement...
Ellipsometer spectroscopic - IR-VASE®
The IR-VASE® is the first and only spectroscopic ellipsometer to cover the spectral range from 2 to 30 microns (333 to...
Ellipsometer spectroscopic - IR-VASE®
The IR-VASE® is the first and only spectroscopic ellipsometer to cover the spectral range from 2 to 30 microns (333 to...
Ellipsometer spectroscopic - 190 - 3 500 nm | SENresearch
The spectroscopic ellipsometer SENresearch measures thin film thickness, refractive index, extinction coefficient, and related properties of bulk materials, single layers, and multi‑layer stacks. Isotropic and anisotropic materials, surface and interface roughness as well as gradients can be analyzed. Furthermore, SpectraRay/3,...
Ellipsometer spectroscopic - 190 - 3 500 nm | SENresearch
The spectroscopic ellipsometer SENresearch measures thin film thickness, refractive index, extinction coefficient, and related properties of bulk materials, single layers, and multi‑layer stacks. Isotropic and anisotropic materials, surface and interface roughness as well as gradients can be analyzed. Furthermore, SpectraRay/3, SENTECH proprietary ellipsometer software, treats sample effects like depolarization, non-uniformity, scattering (Mueller-matrix), and backside reflection.
The SENresearch represents the high end of SENTECH spectroscopic ellipsometers. The compact table top instrument comprises the ellipsometer optics, goniometer, sample platform, auto-collimating telescope, light source, and detection unit. It can be extended
The SENresearch is focused on speed and accuracy for insitu and exsitu measurements of thin films wherever they are applied. Applications range from measuring on textured surfaces to determining the conductivity of TCO films, from insitu monitoring of deposition processes to offline mapping on large glass panels. With the latest development launched by SENTECH, magneto‑optical properties can be characterized. For a large variety of applications predefined recipes are offered by SpectraRay/3 for spectroscopic ellipsometer.
The SENresearch represents the high end of SENTECH spectroscopic ellipsometers. The compact table top instrument comprises the ellipsometer optics, goniometer, sample platform, auto-collimating telescope, light source, and detection unit. It can be extended
The SENresearch is focused on speed and accuracy for insitu and exsitu measurements of thin films wherever they are applied. Applications range from measuring on textured surfaces to determining the conductivity of TCO films, from insitu monitoring of deposition processes to offline mapping on large glass panels. With the latest development launched by SENTECH, magneto‑optical properties can be characterized. For a large variety of applications predefined recipes are offered by SpectraRay/3 for spectroscopic ellipsometer.
Ellipsometer spectroscopic - 370 - 1 050 nm | SENpro
The spectroscopic ellipsometer SENpro features simple operation, measurement speed, and combined data analysis of ellipsometric measurements at different angles of incidence. It measures in the spectral range of 370 nm to 1,050 nm....
Ellipsometer spectroscopic - 370 - 1 050 nm | SENpro
The spectroscopic ellipsometer SENpro features simple operation, measurement speed, and combined data analysis of ellipsometric measurements at different angles of incidence. It measures in the spectral range of 370 nm to 1,050 nm....
Ellipsometer spectroscopic - 1.7  – 25 µm | SENDIRA
The spectroscopic ellipsometer SENDIRA measures thin film thickness, refractive index, extinction coefficient, and related properties of bulk materials, single layers, and multi-layer stacks. Especially layers below covering...
Ellipsometer spectroscopic - 1.7  – 25 µm | SENDIRA
The spectroscopic ellipsometer SENDIRA measures thin film thickness, refractive index, extinction coefficient, and related properties of bulk materials, single layers, and multi-layer stacks. Especially layers below covering...
Ellipsometer spectroscopic / automated - SENDURO®
The SENDURO® measures refractive index and thickness of single films and layer stacks on transparent and reflective substrates. High sample throughput rate, minimized installation effort, and low cost of maintenance...
Ellipsometer spectroscopic / automated - SENDURO®
The SENDURO® measures refractive index and thickness of single films and layer stacks on transparent and reflective substrates. High sample throughput rate, minimized installation effort, and low cost of maintenance...
Ellipsometer laser - SE 400adv
The laser ellipsometer SE 400adv can be utilized to characterize single films and substrates from selectable, application specific angles of incidence. The auto-collimating telescope ensures precise measurement on most kinds of absorbing or transparent substrate with a flat, reflective...
Ellipsometer laser - SE 400adv
The laser ellipsometer SE 400adv can be utilized to characterize single films and substrates from selectable, application specific angles of incidence. The auto-collimating telescope ensures precise measurement on most kinds of absorbing or transparent substrate with a flat, reflective...