Atomic emission spectrometers: S-OES, GD-OES, ICP-OES...

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LECO

GDS spectrometer / glow discharge - GDS500A

The GDS500A CCD-based Glow Discharge Atomic Emission Spectrometer is based on the latest technology. This technology was specifically made for elemental determination, that is a routine, in most ferrous materials. It comes with stability, precision, performance and...

GDS spectrometer / glow discharge - GDS500A

The GDS500A CCD-based Glow Discharge Atomic Emission Spectrometer is based on the latest technology. This technology was specifically made for elemental determination, that is a routine, in most ferrous materials. It comes with stability, precision, performance and accuracy. It is durable and is very easy to use. It is specifically designed for routine production, process, and quality control systems in production environments.

The GDS500A CCD-based Glow Discharge Atomic Emission Spectrometer may be used with a wide range of materials such as steel, iron including as-cast, aluminum, copper, zinc, nickel, cobalt, tungsten, and titanium. It can also work with low melting alloys, powder metals, resulphurized steel and other difficult materials. It has many benefits as it runs linear calibrations with wide dynamic range. It performs uniform sample excitation with precision. It offers freedom from metallurgical history. It is economical to use as it consumes less Ar gas. It performs quick matrix change with minimal memory effects.

GDS spectrometer / glow discharge - GDS850A

The GDS850A from Leco is a glow discharge atomic emission spectrometer, or GDS. The Leco's spectrometers are a suitable tool for spectral measurement, offering accuracy in elemental heavy analysis, including quantitative depth profiling...

GDS spectrometer / glow discharge - GDS850A

The GDS850A from Leco is a glow discharge atomic emission spectrometer, or GDS. The Leco's spectrometers are a suitable tool for spectral measurement, offering accuracy in elemental heavy analysis, including quantitative depth profiling for coatings analysis and surface treatments applications.

The GDS850 can constantly operate a depth profile analysis (QDP) from nanometers to hundreds of micrometers, aiding in the recognition of possible problems with materials like coverings, layers, and thermochemical treatments. The unit delivers total chemical composition, ppm to 100%, from the surface to the substrate in only a few minutes.

All elements are obtained simultaneously, enhancing sample throughout while reducing cost-per-analysis. The device is equipped with a turn-key solution, configured and calibrated for sample matrices. The samples can be tested instantly after the installation.
LTB Lasertechnik Berlin GmbH

Laser-induced plasma spectrometer / LIBS - DSC 1000

The DS 1000 from LTB Lasertechnik Berlin is a drilling core scanner that offers fast...

Laser-induced plasma spectrometer / LIBS - DSC 1000

The DS 1000 from LTB Lasertechnik Berlin is a drilling core scanner that offers fast elemental analyzing to a large field of users working in mineralogy, exploration and construction engineering. It is fully software-controlled, with a length of 1000mm. In addition, it consists of a high power Nd:YAG laser, and video monitoring options.

Laser-induced plasma spectrometer / LIBS

The LIBS system or Laser Induced Breakdown Spectroscopy, is developed by LTB Lasertechnik Berlin...

Laser-induced plasma spectrometer / LIBS

The LIBS system or Laser Induced Breakdown Spectroscopy, is developed by LTB Lasertechnik Berlin GmbH. It is designed for the qualitative and quantitative elemental analysis, and can be used in applications in material analysis and process control. The LIBS systems come with a PC and 2 TFT monitors, mercury lamp for calibration, and programmable delay electronics.
HORIBA Scientific

ICP-OES spectrometer - 120 - 800 nm | Ultima Expert

The Ultima Expert ICP OES spectrometer is a unique combination of ultimate performance with comprehensive assistance Tools designed to simplify method development.
Ultima Expert integrates high efficiency...

ICP-OES spectrometer - 120 - 800 nm | Ultima Expert

The Ultima Expert ICP OES spectrometer is a unique combination of ultimate performance with comprehensive assistance Tools designed to simplify method development.
Ultima Expert integrates high efficiency...

ICP-OES spectrometer - 120 - 800 nm | Ultima Expert LT

The Ultima Expert LT ICP OES spectrometer provides high performance at affordable price for laboratories with challenging samples....

ICP-OES spectrometer - 120 - 800 nm | Ultima Expert LT

The Ultima Expert LT ICP OES spectrometer provides high performance at affordable price for laboratories with challenging samples....

Glow discharge spectrometer / GDS - 110 - 800 nm | GD-Profiler 2™

The GD-Profiler 2™ is the ideal analytical tool for coated material studies, process elaboration and control as it offers ultra-fast elemental depth profile analysis of thin...

Glow discharge spectrometer / GDS - 110 - 800 nm | GD-Profiler 2™

The GD-Profiler 2™ is the ideal analytical tool for coated material studies, process elaboration and control as it offers ultra-fast elemental depth profile analysis of thin and thick layers, conductive or isolating, with high sensitivity to all elements.

The system combines a glow discharge source powered by pulsed radio frequency with the ability to sputter layer by layer a representative area of the material investigated together with a high resolution and high sensitivity emission spectrometer that will measure in real-time all elements of interest.

It provides fast, simultaneous analysis of elements including the gases nitrogen, oxygen, hydrogen and chlorine.

Glow discharge spectrometer / GDS - 110 - 800 nm | GD-Profiler HR™

The GD-Profiler 2™ is the ideal analytical tool for coated material studies, process elaboration and control as it offers ultra-fast elemental depth profile analysis...

Glow discharge spectrometer / GDS - 110 - 800 nm | GD-Profiler HR™

The GD-Profiler 2™ is the ideal analytical tool for coated material studies, process elaboration and control as it offers ultra-fast elemental depth profile analysis of thin and thick layers, conductive or isolating, with high sensitivity to all elements.

The system combines a glow discharge source powered by pulsed radio frequency with the ability to sputter layer by layer a representative area of the material investigated together with a high resolution and high sensitivity emission spectrometer that will measure in real-time all elements of interest.

It provides high resolution to solve analytical problems even in the most complex matrices.
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