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Ellipsometers
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Ellipsometer laser - 632.8 nm
The PHE101 is a wavelength ellipsometer. The device has a high accuracy and repetition due to its new features. The device operates through...
Ellipsometer laser - 632.8 nm
The PHE101 is a wavelength ellipsometer. The device has a high accuracy and repetition due to its new features. The device operates through...
Ellipsometer - 543 nm, 594 nm, 612 nm, 635 nm, 1164 nm
The PHE101M is a multi-wavelegnth ellipsometer from Angstrom Advanced that is ideal for measuring the refractive index and thickness of single and multi-layer...
Ellipsometer - 543 nm, 594 nm, 612 nm, 635 nm, 1164 nm
The PHE101M is a multi-wavelegnth ellipsometer from Angstrom Advanced that is ideal for measuring the refractive index and thickness of single and multi-layer...
Ellipsometer spectroscopic - 250 - 1700 nm
The PHE-102 series is a variable angle spectroscopic ellipsometer operating in the spectral range 250-1,100 nm, 250-1,700 nm or 250-2,100 nm. In the PHE-102 ellipsometer, a broad band white light source is used to illuminate the...
Ellipsometer spectroscopic - 250 - 1700 nm
The PHE-102 series is a variable angle spectroscopic ellipsometer operating in the spectral range 250-1,100 nm, 250-1,700 nm or 250-2,100 nm. In the PHE-102 ellipsometer, a broad band white light source is used to illuminate the sample spot. The layer stack imparts a change in state of polarization to the light and is reflected back through the analyzer and into the detector; where it is measured under the ellipsometric parameters of Psi and Delta.
The spectral dependence of the refractive index, dielectric constants of the materials and other parameters under measurement are determined by comparing the measured data to a theoretical model, which defines the layer structure in detail. The user friendly PHE Spectroscopic software allows the user to measure and analyze multiple material layers and complex thin film structures with mixed layers, interface layers and other qualities.
The spectral dependence of the refractive index, dielectric constants of the materials and other parameters under measurement are determined by comparing the measured data to a theoretical model, which defines the layer structure in detail. The user friendly PHE Spectroscopic software allows the user to measure and analyze multiple material layers and complex thin film structures with mixed layers, interface layers and other qualities.
Ellipsometer for PV applications / laser - 632.8 nm | PhE101S
The PhE101S is very easy to use and can be fitted with the new laser alignment tool, which greatly improves the ease of use and speed of...
Ellipsometer for PV applications / laser - 632.8 nm | PhE101S
The PhE101S is very easy to use and can be fitted with the new laser alignment tool, which greatly improves the ease of use and speed of operation when compared to conventional ellipsometers. It has 3 measurement modes that are based on harmonic analyses and one measurement mode based on minimum search. This minimum search mode gives correct results for very thin layers, which is normally not possible with rotating analyzer ellipsometers. The Angstrom-Advanced received the Schmidt-Roemhild Technology Award for minimum search technology.
Ellipsometer spectroscopic - 250 - 2100 nm | PHE 103
The PHE spectroscopic ellipsometer software has a model and film library with predetermined measurement parameters, which allow the operator to select an application and quickly execute a measurement. The library includes several hundred...
Ellipsometer spectroscopic - 250 - 2100 nm | PHE 103
The PHE spectroscopic ellipsometer software has a model and film library with predetermined measurement parameters, which allow the operator to select an application and quickly execute a measurement. The library includes several hundred of different models. The user friendly PHE Spectroscopic software allows the user to measure and analyze multiple material layers and complex thin film structures with mixed layers, interface layers and much more. The state-of-art software has several hundred material models. The PHE-102 ellipsometer includes all the hardware and software needed for acquiring and analyzing all sample data. In addition, PHE-103 ellipsometer software is the most comprehensive program available for data acquisition and analysis. It combines state-of-the-art mathematical fitting algorithms with a large selection of modeling options for fast and accurate data analysis. An advanced spectroscopic ellipsometry software .
Ellipsometer spectroscopic - UV, VIS, N-IR, 45 – 90° | nanofilm_ep4
The nanofilm_ep4 uses a variety of unique features that allow the visualization of your surface in real time. You will see the structure of your sample on a microscopic scale and measure parameters like thickness,...
Ellipsometer spectroscopic - UV, VIS, N-IR, 45 – 90° | nanofilm_ep4
The nanofilm_ep4 uses a variety of unique features that allow the visualization of your surface in real time. You will see the structure of your sample on a microscopic scale and measure parameters like thickness, refractive index and absorption. Maps of selected areas can be received. Instrument combinations with other technologies like AFM, QCM-D, reflectometry, Raman spectroscopy, etc. are possible to receive even more information from your samples. The new generation of microscopic thin film, surface and materials metrology tool uses a combination of auto nulling ellipsometry and microscopy to enable surface characterization with lateral resolution as small as 1 micron. This enables resolving sample areas 1000 times smaller than most non-imaging ellipsometers, even if they use micro spot spectroscopic option.
Ellipsometer - THz-TDS
The THz-TDS manufactured by ACCURION is an ellipsometer that comes with a terahertz spectrometer....
Ellipsometer - THz-TDS
The THz-TDS manufactured by ACCURION is an ellipsometer that comes with a terahertz spectrometer. This device is used in probing the properties of a certain material by the means of a short pulse from terahertz radiation. It is supplied with a detection and generation scheme that is really sensitive when it comes to the amplitude and phase of the terahertz radiation.
Cell for ellipsometry
The SPR Series manufactured by Accurion, is a cell used for an ellipsometry that has a microfluidic cell...
Cell for ellipsometry
The SPR Series manufactured by Accurion, is a cell used for an ellipsometry that has a microfluidic cell and flexible design. This device is equipped with a manual microfluidic liquid handling unit that enables it for an easy usage.
Moreover, the SPR cell is applicable for applications or operations like protein-drug interaction, binding of lipids and membranes, peptide-protein reaction and etc.
Moreover, the SPR cell is applicable for applications or operations like protein-drug interaction, binding of lipids and membranes, peptide-protein reaction and etc.
Ellipsometer AFM
The new generation of microscopic thin film, surface and materials metrology tool uses a combination of auto nulling ellipsometry and microscopy to enable surface characterization with lateral resolution as...
Ellipsometer AFM
The new generation of microscopic thin film, surface and materials metrology tool uses a combination of auto nulling ellipsometry and microscopy to enable surface characterization with lateral resolution as small as 1 micron. This enables resolving sample areas 1000 times smaller than most non-imaging ellipsometers, even if they use micro spot spectroscopic option. The nanofilm_ep4 uses a variety of unique features that allow the visualization of your surface in real time. You will see the structure of your sample on a microscopic scale and measure parameters like thickness, refractive index and absorption. Maps of selected areas can be received. Instrument combinations with other technologies like AFM, QCM-D, reflectometry, Raman spectroscopy, etc. are possible to receive even more information from samples.
Ellipsometer - nanofilm_ep4
The Nanofilm_EP4, manufactured by Accurion® is an imaging ellipsometry combined with quartz crystal microbalance,...
Ellipsometer - nanofilm_ep4
The Nanofilm_EP4, manufactured by Accurion® is an imaging ellipsometry combined with quartz crystal microbalance,...
Ellipsometer spectroscopic / automated - 190 - 2 100 nm | UVISEL 2
UVISEL 2 is a fully automated and integrated spectroscopic ellipsometer enabling accurate thin film thickness and optical constants characterization over the wavelength range 190 - 2100 nm.
Sample alignment, autofocus, spot size selection,...
Sample alignment, autofocus, spot size selection,...
Ellipsometer spectroscopic / automated - 190 - 2 100 nm | UVISEL 2
UVISEL 2 is a fully automated and integrated spectroscopic ellipsometer enabling accurate thin film thickness and optical constants characterization over the wavelength range 190 - 2100 nm.
Sample alignment, autofocus, spot size selection, variable angle and mapping functions all benefit from computer control. The UVISEL 2 has 8 computer selectable, achromatic spot sizes enabling high quality measurements in small areas.
The UVISEL 2 includes an innovative, color imaging vision system allowing the user to visualize the beam spot on all types of materials.
The phase modulation technology combined with an advanced optical design provide unparalleled accuracy and high resolution ellipsometric measurements for characterizing ultra thin as well as thick films.
System control, data measurement, simulation, modeling, reporting and automation are seamlessly integrated by the powerful DeltaPsi2 software Platform.
Sample alignment, autofocus, spot size selection, variable angle and mapping functions all benefit from computer control. The UVISEL 2 has 8 computer selectable, achromatic spot sizes enabling high quality measurements in small areas.
The UVISEL 2 includes an innovative, color imaging vision system allowing the user to visualize the beam spot on all types of materials.
The phase modulation technology combined with an advanced optical design provide unparalleled accuracy and high resolution ellipsometric measurements for characterizing ultra thin as well as thick films.
System control, data measurement, simulation, modeling, reporting and automation are seamlessly integrated by the powerful DeltaPsi2 software Platform.
Ellipsometer spectroscopic - 190 - 2 100 nm | UVISEL
Built on 25 years of experience, the UVISEL phase modulated ellipsometer delivers high precision and high resolution measurements with the best signal to noise ratio ideal for research on nano and micro scale structures. It is the most sensitive tool for accurate characterization...
Ellipsometer spectroscopic - 190 - 2 100 nm | UVISEL
Built on 25 years of experience, the UVISEL phase modulated ellipsometer delivers high precision and high resolution measurements with the best signal to noise ratio ideal for research on nano and micro scale structures. It is the most sensitive tool for accurate characterization of film thickness, optical constants, and material properties.
The UVISEL delivers long-term, stable measurements without the need for regular calibration.
The full wavelength range covered by the UVISEL is 190 - 2100 nm. The use of monochromators enables the selection of the spectral range and resolution that best suits your measurement needs.
The UVISEL ellipsometer offers a flexible design, enabling the best fit to your application needs.
- Manual or automatic goniometer, sample stage and microspot optics
- Large variety of accessories
- Ex-situ, in-situ and affordable configurations available
The DeltaPsi2 software offers complete functionality for measurements, modeling and reporting in addition to automatic operations, which facilitate routine thin film analysis.
The UVISEL delivers long-term, stable measurements without the need for regular calibration.
The full wavelength range covered by the UVISEL is 190 - 2100 nm. The use of monochromators enables the selection of the spectral range and resolution that best suits your measurement needs.
The UVISEL ellipsometer offers a flexible design, enabling the best fit to your application needs.
- Manual or automatic goniometer, sample stage and microspot optics
- Large variety of accessories
- Ex-situ, in-situ and affordable configurations available
The DeltaPsi2 software offers complete functionality for measurements, modeling and reporting in addition to automatic operations, which facilitate routine thin film analysis.
Ellipsometer spectroscopic - 147 - 2 100 nm | UVISEL 2 VUV
The UVISEL 2 VUV is a ne generation of phase modulation ellipsometer for VUV measurement. It is the main spectroscopic ellipsometer available, intended to convey the quickest thin film measurements over the biggest...
Ellipsometer spectroscopic - 147 - 2 100 nm | UVISEL 2 VUV
The UVISEL 2 VUV is a ne generation of phase modulation ellipsometer for VUV measurement. It is the main spectroscopic ellipsometer available, intended to convey the quickest thin film measurements over the biggest wavelength range, from 147 to 2100 nm. The UVISEL 2 VUV is a half and half ellipsometer, fit for working in 2 modes, under nitrogen or essential vacuum. Its mechanical outline is improved for low nitrogen utilization down to 6l/min, and considers quick sample loading.
The option of eight spot sizes is perfect for minimal area measurement and a promptly available chamber in front makes sample loading extremely suitable. It incorporates double high power vitality sources, high throughput optics, a Caf2 photograph flexible modulator and two advanced monochromators. The UVISEL 2 VUV gives high sensitivity at VUV wavelengths.
The option of eight spot sizes is perfect for minimal area measurement and a promptly available chamber in front makes sample loading extremely suitable. It incorporates double high power vitality sources, high throughput optics, a Caf2 photograph flexible modulator and two advanced monochromators. The UVISEL 2 VUV gives high sensitivity at VUV wavelengths.
Ellipsometer spectroscopic - 440 - 1 000 nm | Auto SE
The Auto SE is a spectroscopic ellipsometer, manufactured by HORIBA Scientific. It enables automatic analysis of thin film samples with simple...
Ellipsometer spectroscopic - 440 - 1 000 nm | Auto SE
The Auto SE is a spectroscopic ellipsometer, manufactured by HORIBA Scientific. It enables automatic analysis of thin film samples with simple push button operation. In a few seconds, a complete analysis report is generated, containing information on thickness, optical constants, surface roughness, and film inhomogeneities.
The Auto SE features automatic XYZ stage, real-time imaging of the measurement site and an automated spot size selection.
The Auto SE is suitable for routine thin film measurement and device quality control.
The Auto SE features automatic XYZ stage, real-time imaging of the measurement site and an automated spot size selection.
The Auto SE is suitable for routine thin film measurement and device quality control.
Ellipsometer spectroscopic - 450 - 1 000 nm | Smart SE
The instrument Smart SE is spectroscopic ellipsometer. Very fast and accurate thin film measurement can be done with the help of it. It has the ability to characterize the thin film thickness from minute 20µm, optical constants (n,k) and even properties of film...
Ellipsometer spectroscopic - 450 - 1 000 nm | Smart SE
The instrument Smart SE is spectroscopic ellipsometer. Very fast and accurate thin film measurement can be done with the help of it. It has the ability to characterize the thin film thickness from minute 20µm, optical constants (n,k) and even properties of film...