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TEM microscope / transmission electron - JEM-2100F
Jeol JEM-2100F is a multipurpose 200 kV field emission, FE, analytical electron microscope. Several versions are available to suit specific needs. Unlike conventional thermionic electron guns, a highly stable and visible electron probe is produced by the FE electron gun or FEG. This is a must for ultrahigh resolution in scanning transmission electron microscopy, or STEM, and also when analysing nano-scaled samples.
The PC system of the microscope control allows ready integration with a range of analytical devices and/or cameras. Examples include energy dispersive X-ray spectrometer, electron energy loss spectrometer or CCD cameras.