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Scanning probe microscope / SPM - LEAP 4000X HR
High Performance 3D Atom Probe for Advanced Materials and Metals ApplicationsThe LEAP 4000X HRTM is a high performance 3D atom probe microscope which provides nano-scale surface, bulk and interfacial materials analysis of simple and complex structures with atom by atom identification and accurate spatial positioning.
The system works using the principle of field evaporation, whereby a strong electric field applied to the specimen is sufficient to cause removal of atoms by ionization. Atom removal is triggered either via a voltage or laser pulse applied to the sample.
The LEAP HR provides the following key features:
Excellent field of view with good mass resolution
Local electrode and microtip compatibility
Local Electrode and Microtips
"LEAP" is derived from Local ElectrodeTM Atom Probe. The Local ElectrodeTM provides a strong technological advantage over systems which do not have one, improving both ease of use and data quality. The Local Electrode also enables the use of prefabricated MicrotipTM arrays. Using these enables multiple analytical specimens to be prepared, mounted and loaded into the instrument for maximum efficiency with multi experiment scenarios.