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Scanning electron microscope / SEM - ZEISS EVO
The ZEISS EVO MA Series is suitable for working on a vast array of material samples. It features both beam deceleration and high definition back scattered electron imaging in order to capture topographical details at reduced voltages. Automatic workflows will benefit from the high productivity of this series. Using specialized X-ray geometry, these EVO machines produce high resolution performance for analytical working conditions. A wide assortment of specimen sizes can be managed by the device's three different chamber sizes.
This device features a standard variable pressure operation and can be upgraded in order to observe materials in real time.