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Microscope / field emission scanning / electronic / ultra field emission scanning FE / for analysis - ZEISS MERLIN
Zeiss Merlin provides analytical capabilities for the sub-nanometer world. Merlin with the GEMINI II column is a combination of super fast analytics, high resolution imaging with excellent detection capabilities, and a future-proof flexibility of configuration in one unit. The GEMINI II optics are prealigned. This ensures easy adjustment of imaging settings, like voltage or probe current, spanning several orders of magnitudes. This enables matching of application and sampling with next, without any realignment.
Excellent results in nano-analytics are provided. This is made possible with the optimization of system for high density of current, up to 300 nA probe currents, and excellent resolution at high beam currents.
Merlin provides excellent detection of parallel, on-axis and in-lens, secondary electron (SE). It also has energy selective backscattered (EsB) detection capabilities. This results in identification of the minutest differences in composition of materials, thereby generating maximum information from samples.
Merlin can be customized as per application requirements due to its modular chamber design, over 15 ports, and several other modules.
All groups of users, including novices, will find the application helpful.