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Atomic force microscope - Inspire™
Bruker's Inspire TM system acquires nanoscale infrared absorption and then reflects maps at regular AFM imaging speeds, without the limitations caused through indirect mechanical approaches or for added complexities for the user. The system is able to instantly correlate atomic scale nanomechanics with infrared sSNOM spatio-spectral imagine at 10- nanometer resolution, and special nano electrical measurements. Put simply, Inspire redefines the possibilities with atomic force microscopy.