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AFM microscope / atomic force - attoAFM III
The attoAFM III is an atomic force microscope designed particularly for applications at low and ultra low temperature. Due to the non-optical shear force detection based on a tuning fork, this system is ideally suited for applications where input of light is problematic. A typical application of the attoAFM III microscope is Scanning Gate Microscopy (SGM) on semiconductor structures. This microscope is also compatible with the commercially available Akiyama probe.01 LT and HV compatible feedthroughs
02 vacuum window
03 microscope insert
04 superconducting magnet (optional)
05 liquid He dewar (optional)
06 ultra stable Titanium housing
07 xyz coarse positioners
08 xy scanner
09 sample
10 tuning fork including LT compatible preamplifier