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AFM microscope / atomic force - attoAFM I
The attoAFM I is a compact atomic force microscope designed particularly for applications at low and ultra low temperatures. The instrument works by scanning the sample below a fixed cantilever and by measuring its deflection with highest precision using a fiber based optical interferometer. Both contact and non-contact mode are applicable. Furthermore, this system is suited for Magnetic Force Microscopy (MFM), Electric Force Microscopy (EFM), and other imaging modes. The extreme stability of the measurement head allows also for combination with cryogen free pulse-tube based cooling systems for applications where liquid Helium is not available or desired.