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X-ray fluorescence spectrometer / XRF - SPECTRO MIDEX
The X-ray fluorescence is developed because of certain requirements and details. It has been extended and optimized resulting to a more analytical performance and ease of use. This instrument performs an essential task in the industry including research and sciences, which specifically requires a non-destructive measuring system that is sensitive and offers a limited measuring spot. The spectrometer is now on its third generation thus, has been totally optimized into a more flexible device for the purpose of faster, non-destructive analysis of small spots, and the rapid mapping of large surfaces (up to double EC format, 233x160 mm, 9.2x6.3’’).