Microscope positioning stage / autofocus - 2.5 - 100x | ECLIPSE LV-DAF

Microscope positioning stage / autofocus - 2.5 - 100x | ECLIPSE LV-DAF
Nikon Metrology LV-DAF is known for delivering versatile and fast autofocus due to the Hybrid Auto-Focus system integrated into the design. In addition to this, slit projection is combined with contrast detection auto focus to produce a large focus range, as well as fast tracking ability.

The item supports various observation methods, including darkfield and brightfield, as well as differential interference contrast (DIC) and transparent samples of various types.

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