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Ellipsometer spectroscopic - 1 - 10 µm | Elli-SE
For diverse applications, the Elli-SE Spectroscopic Ellipsometer is available in a wide range of configurations.Elli-SE Spectroscopic Ellipsometer
Elli-SE Spectroscopic Ellipsometer (SE) is the industry standard technology that enables one to accurately measure thickness and optical constants of thin film, simultaneously. It is used for the characterization of a variety of materials (e.g., dielectrics, semiconductors, organics, etc.) including AR coatings, OLED, and low (high) -materials.