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Ellipsometer for PV applications / laser - 632.8 nm | PhE101S
The PhE101S is very easy to use and can be fitted with the new laser alignment tool, which greatly improves the ease of use and speed of operation when compared to conventional ellipsometers. It has 3 measurement modes that are based on harmonic analyses and one measurement mode based on minimum search. This minimum search mode gives correct results for very thin layers, which is normally not possible with rotating analyzer ellipsometers. The Angstrom-Advanced received the Schmidt-Roemhild Technology Award for minimum search technology.