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Film thickness measuring instrument - 20 nm - 1200 µm | C12562-02
The Optical NanoGauge Film Thickness C12562 utilizes a spectral interferometry application. To continue, it is a film measurement device that does not require contact in order to function. The device can remarkably measure even the slimmest 10nm film. The Optical Gauge series has the ability to measure width ranges from 10nm to 100μm maximum. This device can measure even at incredible speed of up to 100 Hz.