+7 (812) 645-08-06
Inspection microscope / for semiconductors - MX61A
Specifically engineered for optimal productivity and integration, the MX61A semiconductor microscope enables operators to work in a user-friendly position smoothly throughout extended inspection periods. What was already the best in its field is enhanced by the introduction of the new UIS2 optical system, an upgrade of the previous series' UIS optics. The MX61A's darkfield observation image brightness has been increased four-fold producing clear, crisp, true color images evident in all illumination techniques including brightfield, darkfield and differential interference contrast (DIC).