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Semiconductor test system - S500
These configurable, instrument based devices are S500 Integrated Test Systems. They are useful in device, wafer or cassette level semiconductor characterization. These innovative measurement mechanisms are combined with a flexible system in order to better meet customer needs. The Automated Characterization Suite, or ACS, software is used in conjunction with the specialized measurement features on this device to provide a vast array of product applications not met by other models currently on the market.
These systems come with full-range source measurement units specifications such as subfemtoamp measurement. A vast array of measurements can be made on various devices. Charge pumping, single pulse PIV, PIV sweeps, pulse generation and incredibly rapid I-V memory characterization are all additional features of these systems.