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Diffractometer X-ray / XRD - BTX Profiler
With the BTX Profiler, XRF and XRD analysis technology is combined into a single benchtop system for the purpose of compositional analyzing at the elemental and structural level. It is designed to allow seamless integration of information and results, which results in economic operational costs, time-efficiency and space-efficiency. The 2D-XRD technology allows for mineralogy phase analysis.The XRD technology featured with the BTX Profiler is also utilized in NASA’s Curiosity Rover, which is part of the Mars Science Laboratory program. The Earth-bound technology employed in the Olympus XRF/XRD instruments is award-winning.