HTS microplate reader - HTS-XT

HTS microplate reader - HTS-XT
Bruker Optics The microplate extension HTS-XT allows the application of FT-IR spectroscopy as method for high-throughput screening. The acquisition, control and evaluation of spectral data from large numbers of samples are performed by the OPUS/LAB software. OPUS/LAB also controls the microplate stacking device Twister that permits a continuous...

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