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Raman spectrometer - Raman AFM and nano-Raman TERS
HORIBAs Raman technology is easily coupled to scanning probe microscopes (SPM). The Platform allows Atomic Force Microscopy (AFM), near-field optical techniques (SNOM, NSOM), Scanning Tunneling Microscopy (STM) and confocal optical spectroscopy (Raman and Fluorescence Imaging) in one versatile instrument, ready for Tip-Enhanced Raman Spectroscopy (TERS) or co-localized measurements.The exceptional long-term stability and speed of our integrated Raman-AFM Platform bring reliable results both for co-localized measurements and TERS Imaging. A unique Platform for simultaneous measurements ensures the images you get are truly correlated.